World leader in customized focused ion and electron beam technology
Maskless and targeted creation of arrays of color centers in diamond with i-FIB
Cobra ExB in the Andromede Project: A rising generation of NAno Particle Ion Source (NAPIS) column
Ultimate nanopatterning of Si substrate with Cobra ExB mass-filtered FIB column
In-situ Scanning Electron Microscope (SEM) supplements Scanning Probe Microscopy (SPM) for accurate probe positioning and electrical measurements
Xe plasma FIB (i-FIB) Delayering technology using water as Gas-Assisting Etching (GAE) enhancer
Curtaining-Free Top-Down TEM Lamella Preparation from a Cutting Edge Integrated Circuit using a Rocking-Stage and water as Gas-Assisting Etching (GAE) enhancer
Chemical Nano-Characterization by Correlative Analyzes in Electron Microscopy and Secondary Ions Mass Spectroscopy: Example on Ni-Based Superalloys
