Events

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7th EUFN Workshop 2024

the 24th International Conference on Secondary Ion Mass Spectrometry (SIMS-24)

This 15th SRI conference will again be hosted by Deutsches Elektronen-Synchrotron (DESY) and the European XFEL

The 30th International Conference on Amorphous and Nanocrystalline Semiconductors

the Microscopy and Microanalysis (M&M) community gathers to celebrate and showcase the latest advancements in this fascinating realm of scientific exploration

Scanning electron microscopy and microanalysis

11th CAM-Workshop on Failure Analysis and Material Diagnostics of Electronics Components

This 19th ANADEF WORKSHOP will once again bring together all the experts in the world of French Failure Analysis

The 67th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication

The Eighth Conference on Frontiers of Aberration Corrected Electron Microscopy

49th International Symposium for Testing and Failure Analysis

AVS 69th International Symposium & Exhibition

The 20th International Microscopy Congress

Developments in single ion implantation and the applications of impurities and defects for quantum technologies.

Workshop 2023

GDR Imagerie par Spectrométrie de Masse

6th European FIB Network Workshop 2023

Materials research community

The 56th Annual Meeting of the Israel Society for Microscopy

DPG Meeting of the Condensed Matter Section in Dresden

Microscopy Conference

AVS 68th INTERNATIONAL SYMPOSIUM & EXHIBITION : "Imperfectly Perfect Materials"

48th International Symposium for Testing and Failure Analysis (ISTFA) : Chasing ever-smaller and more elusive defects

rencontres des meilleurs experts de la recherche et de l'innovation

European Materials Research Society organises 17 parallel symposia for discussing recent advances in the field of materials science

The leading conference on nano and micro engineering

23rd international Conference on Secondary Ion Mass Spectrometry

European FIB Network workshop in Hamburg

the premier microscopy education and networking event of the year

dedicated to recent advances in 3D additive manufacturing and etching with focused electron beams at the nanoscale

Focused Charged Particle Beam Week in Krakow, Poland organized by FIT4NANO and institute of Nuclear Physics, Polish Academy of Sciences

INNOVATION IN FAILURE ANALYSIS AND MATERIAL DIAGNOSTICS OF ELECTRONICS COMPONENTS

analyse et mécanismes de défaillance des composants pour l'électronique

Groupement National de Microscopie Electronique à Balayage et de Microanalyses

European Materials Research Society

European Association on Applications of Surface and Interface Analysis - Limerick, Ireland

Materials Research Society

Paris

München