SED
Secondary Electron Detector
for greater topography imaging
Thanks to a highly effective secondary electron collection, SED guarantees a sufficient brightness even for low particle emissions. Based on the Everhart-Thornley detection principle, Orsay Physics SED achieves high dynamic imaging. It includes a scintillator, a light pipe and a photomultiplier to intensify effectiveness of gathered secondary electrons.
It is customized to perfectly fit into any vacuum chambers and to ensure the best image quality.
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Key Features |
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Adjustable parameters |
Collector voltage / Accelerating |
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Main Characteristic |
Lenght-customizable nozzle |
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Option |
Non-sensitive to light detector |
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Adaptation Requirement |
35 CF flange |
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Optional UHV configuration |
Maximum bakeout temperature |
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Rare-earth carbonate mineral from the extraction of strontium (FOV = 1.35 mm)
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SE image of Ga and GaN on silicon (FOV = 5 µm)
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Overview of a solder ball array (FOV = 3.2 mm)