World leader in customized focused ion and electron beam technology

SEM

What is SEM?

Application
Note Download Technical Sheet

e-CLIPSE Plus

High resolution electron imaging
for all your analysis

e-CLIPSE Plus is the ultimate electrostatic SEM present on worldwide market offering extreme compactness thanks to its objective design. This SEM column is optimized to reach the best resolution at large working distance (compared to standard electro-magnetic SEM columns). e-CLIPSE Plus enables to work at both low and high currents keeping a sharp beam especially for analysis. Its wide energy range allows to reach great performances on a large panel of applications from equipment manufacturers to R&D laboratories.

  Key Features

  Source

  Schottky FEG (Field Emission Gun)

  Energy Range

  500 eV - 30 keV

  Probe Current

  10 pA - 100 nA

  Working Distance

  12 mm (up to 45 mm)

 

 

  • High resolution imaging of dust using e-CLIPSE Plus

  • Carbon nanowires observation using e-CLIPSE Plus (FOV = 20 µm) Courtesy of National Synchrotron Radiation Research Center (NSRRC)

  • Ant antenna observation using e-CLIPSE Plus (FOV = 250 µm)

Download Technical Sheet

Vortex

Refined SEM column for UHV environment

Vortex is our entirely electrostatic customizable SEM column dedicated to high currents at middle range energy.
Its compactness allows an easy implementation on any dedicated UHV chambers reducing both analysis accessories overcrowding near the sample area and outside the chamber. Each Vortex column is fully personalized to your exact requirement and application such as probe imaging, navigation, surface analysis,... Vortex offers a nice compelling combination of price, ease of use and performances while preserving a good reliability in a UHV environment.

  Key Features

  Source

  Schottky FEG (Field Emission Gun)

  Energy Range

  500 eV - 10 keV

  Probe Current

  20 pA - 10 nA

  Working Distance

  12 mm (up to 45 mm)

 

  • Dust observation in high resolution mode (FOV = 15 µm)

  • Tin balls on carbon plate (FOV = 100 µm)

  • Tip observation with Vortex