Orsay Physics is now a world leader in the field of customized Focused Ion and Electron Beam columns and related equipment such as Gas Injection Systems, ExB mass-filtered columns Wien filter technology, GIS, gas injection module

FIB, O.E.M. Columns, OEM Columns, Orsay Physics develops versatile and reliable focussed ion beam columns Failure Analysis, Auger spectroscopy, 3D Fabrication, UHV columns, Focussed Ion Beam Technology, FEB columns are fully UHV compatible Schottky emitter and electrostatic focussing optics, Liquid Metal Ion sources, Most common LMIS is Gallium, Indium sources Secondary electrons detector, phosphor scintillator detector with optically coupled photomultiplier, UHV compatible

Canion 31, FIB for Auger spectrometer, OptiFib, FIB columns, LEO 430, 440, 1530, 1560, JEOL 35, 840, 845 IC, 6100, 5910, 6460, 6500F, 7000F, HITACHI S-2700, S-3000N, ZEISS 962A, CAMSCAN CS2

FIB retrofit on a Jeol JSM 6460,
:: Introduction
:: Products
:: Applications
:: Users List
:: News
:: Nano Physics
:: Contact
 


:: Products > FIB


O.E.M. Columns

Orsay Physics develops versatile and reliable focussed ion beam columns, using very innovative concepts. We can customise our columns according to specific requirements, for a large number of applications, including Failure Analysis, Auger spectroscopy, 3D Fabrication, etc....



Canion 31

FIB for Auger spectrometer


OptiFib

95 Avenue des Monts Auréliens - ZA Saint-Charles - F - 13710 Fuveau
Phone : +33 442 538 090 - Fax : +33 442 538 091 nano@orsayphysics.com